Powder X-Ray Diffraction Analysis

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Powder X-Ray Diffraction (XRD) is a rapid analytical technique primarily used for a crystalline material of phase purity and can provide information on unit cell dimensions. The analyzed is bulk composite material is, homogenized, and these particles used to be x-ray diffraction. Max von Laue, in 1912, discovered that crystalline material formation three-dimensional diffraction gratings for X-ray exposed similar to the spacing of planes in a crystal lattice. X-ray diffraction is now a common technique for the study of crystal structures and atomic spacing.
Principle
Monochoramatic X-ray is exposed crystalline sample and due to occur constructive interference of X-ray diffraction Patten. These X-rays are generated by a cathode ray tube, produce monochromatic
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The material was analysis (TG/DTA) curve observed peak possible for endothermic or exothermic. The material was carried out instrument for Perkin Elmer thermal analysis different temperature range 30ºC to 300 ºC in nitrogen atmosphere at heat rate 10 ºC. The instrument was using crucible as aluminum, platinum, and gold in inert gases atmosphere or nitrogen gas atmosphere. The TG curve of material was response of mass change due to thermally heat up sample. The DTA curve was correspond material and reference material using difference temperature studied for the both time and temperature measurement. Its change temperature was determined DTA curve for change physical and chemical states and peaks detected DTA signal. This measurement most predominant tool is solid state physics and crystalline chemistry, such as used to water crystallization, study phase change, oxidation and reduction of material. The Thermal analysis was most used identify melting and decompose point, thermal stability, polymerization and glassity formation region, purity and reactivity. [rajesh sir paper

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